Expanded Coverage on Dissecting the Atom: Gemology & Technology By Cara Woudenberg · Online Editor

Educational Resources | Other Resources | Photographs | Back to Original article

Educational Resources

Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)

• American Geophysical Union: Geochemical analysis of small samples: Micro-analytical techniques for the nineties and beyond (LA-ICP-MS).
• Utrecht University, the Netherlands: Department of Petrology's LA-ICP-MS homepage.

Electron Probe Microanalysis (EPMA)

• Electron Probe Microanalysis Laboratory: the Department of Earth and Planetary Science, University of California at Berkeley.
• Micro Analytical Facility: CAMCOR - Center for Advanced Materials Characterization in Oregon, University of Oregon in Eugene, Oregon.

Secondary Ion Mass Spectrometry (SIMS)

• SIMS WWW Server: The World Wide Web site for the exchange of practical information about SIMS.
• Queen Mary, University of London: Department of Chemistry's Surface Analytical Techniques, Secondary Ion Mass Spectrometry

 

Other Resources

CAMECA
• A private company active in the field of EPMA and surface analysis. Focuses on high-end instruments that offer the best technical performance in their specialized fields.
• A world leader for dedicated SIMS instruments (more than 350 installed) and EPMA instruments (more than 600 installed).

CETAC
• A world wide leader in sample handling and sample introduction technologies for chemical analysis, including LA-ICP-MS.
• Provides a comprehensive range of product-based solutions for the analysis of elements in samples.
• Develops products and services that are used in every industry where rapid and accurate determination of elemental trace levels are required.

Evans East
• A commercial materials analysis laboratory, specializing in surface, thin-film, and trace element characterization.
• Offers a wide range of analytical protocols including SIMS, Time-of-Flight SIMS, X-Ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), Scanning Electron Spectrscopy with Energy Dispersive Spectrometry (SEM/EDS), and more.

Photographs

A universal EPMA instrument (model SX100) from CAMECA. A fully digitized instrument with highly integrated electronics and full automation for unattended analysis and evaluation.

A SIMS microprobe (NanoSIMS 50) from CAMECA. Developed for elemental and isotopic analysis of ultra-fine features.

The ADEPT-1010, a Quadrupole Dynamic SIMS (D-SIMS) instrument from Physical Electronics, a partner of Evans East.